X-RAY DIFFRACTION IMAGING AS A TOOL OF MESOSTRUCTURE ANALYSIS, J. Fiala, pp. 24-31
نویسندگان
چکیده
In case that some crystallites in the material under study are greater than, say, ten micrometers, the diffraction lines become spotty and the information on the size, shape, orientation and various structural defects of these crystallites can be inferred by measuring x-ray diffraction images from individual crystallites. In our contribution, we refer to a number of cases where we managed to get valuable information on deformation, recrystallization processes using x-ray imaging, which would be unattainable by other methods.
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